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PPIę  Renishaw Scanning Probe

 

Renishaw's range of scanning probes are all passive sensors, featuring lightweight mechanisms and Xspect Solutions and Renishaw Scanning Probesisolated optical metrology systems for fast and accurate scanning.
Scanning probes are miniature measuring machines that can acquire several hundred surface points each second. Your CMM software can use this data to provide you with information about the form of the features that you measure, as well as their size and position. Scanning probes can also be used to acquire discrete points in a similar way to touch-trigger probes.
Renishaw scanning probes feature innovative, lightweight passive mechanisms (no motors or locking mechanisms) that exhibit a high natural frequency, making them suitable for high speed scanning. Isolated optical metrology systems measure the deflection of the stylus directly (not via stacked axes within the probe mechanism) for better accuracy and faster dynamic response. A range of solutions are available, suitable for all sizes and configurations of CMM.

 

  • SP25M scanning probe system
    At just 25 mm diameter, and with a range of scanning and touch-trigger modules, the SP25M is the world's most compact and versatile scanning probe system.The SP25M's compact size and Autojoint mounting makes it compatible with the PH10M/MQ, PH6M and PHS1 probe heads. It can also be mounted on a multiwired extension bar. Together, these combinations permit excellent reach and access to part features.
    The SP25M is actually two sensors in one! Users can switch between a choice of three scanning modules (which can carry M3 styli with lengths from 20 - 200 mm) and an adaptor module that is compatible with Renishaw's TP20 range of probe modules. This capability enables scanning and touch-trigger probing in a single probe system.
  • SP80 ultra-high accuracy scanning probe
    The SP80 quill-mounted scanning probe provides class-leading scanning performance, as well as the most flexible use of styli for maximum productivity.
    The SP80 is a passive scanning probe that uses digital scale and readheads with 20 nm resolution. These provide exceptional scanning performance, even with long styli.
    The SP80 can carry styli up to 500 mm long and 500 g mass, including star configurations. Unbalanced star configurations do not require counterbalancing. Kinematic stylus changing allows for repeatable re-location of the stylus, optimises stylus arrangements for each feature, and overcomes the need for re-qualification.
    The SP80 has a kinematic mount that offers a repeatable connection to the mating plate mounted on the quill (KM80), allowing the probe to be easily removed.
  • SP600 scanning probes
    Renishaw's SP600 family of analogue scanning probes offers high-performance inspection, digitising and profile scanning capability for a wide range of CMMs.
    Renishaw have three, highly versatile, SP600 scanning probe systems to choose from (SP600, SP600M & SP600Q) to suit a wide range of CMMs. A system includes the probe itself, a PC interface card and a stylus module changing rack. Together, these offer great user flexibility and the capability to meet most of the demands of today's CMMs.
    SP600 probes enable rapid collection of large amounts of measurement data during inspection, digitising or profile scanning and are suitable for a wide range of applications such as gear inspection, sheet metal profile measurement, form measurement, and fine detail scanning.
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